Magnetization reversal process in Fe/Si (001) single-crystalline film investigated by planar Hall effect*
Ye Juna),b), He Weib), Hu Bob), Tang Jinb), Zhang Yong-Shengb), Zhang Xiang-Qunb), Chen Zi-Yua)†, Cheng Zhao-Huab)‡
       
(a) Coordinate system used in MOKE and PHE measurements, and (b) LEED pattern of 40-ML iron film grown on a Si (001) substrate.