Localization correction to the anomalous Hall effect in amorphous CoFeB thin films*
Ding Jin-Juna),b), Wu Shao-Binga), Yang Xiao-Feia), Zhu Taob)†
       
Dependence of the coefficients A R (a) and A AH (b) as defined in Eq. ( 2 ), and of 2 A R − A AH (c) on the sheet resistance R 0. The dashed lines are guides for the eye. The grey range indicates WL corrections to AHC.