Localization correction to the anomalous Hall effect in amorphous CoFeB thin films*
Ding Jin-Juna),b), Wu Shao-Binga), Yang Xiao-Feia), Zhu Taob)†
       
Temperature dependencies of R xx / R xx (5 K) for CoFeB of 1.7 nm (up triangles) and 5.5 nm (down triangles). The solid lines are fitted by using a single logarithmic form, ln( T / T 0).