Effect of the thickness of InGaN interlayer on a-plane GaN epilayer*
Wang Jian-Xiaa),b)†, Wang Lian-Shana)‡, Zhang Qianb), Meng Xiang-Yueb), Yang Shao-Yana), Zhao Gui-Juana), Li Hui-Jiea), Wei Hong-Yuana), Wang Zhan-Guoa)
       
SEM images of the annealed LT-GaN/InGaN/sapphire templates for samples A–F [corresponding to panels (a)–(f)]. The direction of the arrow represents the [0001] orientation of a -GaN.