Mechanism of single-event transient pulse quenching between dummy gate isolated logic nodes<xref ref-type="fn" rid="cpb140521">*</xref>

Mechanism of single-event transient pulse quenching between dummy gate isolated logic nodes*

Chen Jian-Jun†, Chi Ya-Qing, Liang Bin

Fig.#cod#x00A0;6. Distributions of hole density along the channel cross section at 50#cod#x00A0;ps after the ion striking in a layout 2 and b layout 4.