Mechanism of single-event transient pulse quenching between dummy gate isolated logic nodes<xref ref-type="fn" rid="cpb140521">*</xref>

Mechanism of single-event transient pulse quenching between dummy gate isolated logic nodes*

Chen Jian-Jun†, Chi Ya-Qing, Liang Bin

Fig.#cod#x00A0;3. P-hit SET produced in the four different layouts: a SET pulse widths, b SET pulse waveforms in layout 2 and layout 4.