Mechanism of single-event transient pulse quenching between dummy gate isolated logic nodes<xref ref-type="fn" rid="cpb140521">*</xref>

Mechanism of single-event transient pulse quenching between dummy gate isolated logic nodes*

Chen Jian-Jun†, Chi Ya-Qing, Liang Bin

Fig.#cod#x00A0;10. Simulated a SET pulse widths hit the X region, and b SET pulse waveforms in layout 5 and layout 6 LET #cod#x003D; 10#cod#x00A0;MeV#cod#x00B7;cm 2 mg, ions strike at the X region.