Variation of efficiency droop with quantum well thickness in InGaN/GaN green light-emitting diode

Liu Wei^a),^c), Zhao De-Gang†^a), Jiang De-Sheng^a), Chen Ping^a), Liu Zong-Shun^a), Zhu Jian-Jun^a), Li Xiang^a), Liang Feng^a), Liu Jian-Ping^b), Yang Hui^a),^b)

The (0002) ω –2 θ XRD curves of MQWs for all samples, denoted by black, red, and blue lines for W7, W8, and W9, respectively. The inset shows the normalized FWHMs of satellite peak versus the satellite orders, symbols and lines are the experimental data and linear fit curves, respectively.