Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H–SiC
Zhou Tian-Yua),b), Liu Xue-Chao†a), Huang Weia), Zhuo Shi-Yia), Zheng Yan-Qinga), Shi Er-Weia)
       
GIXRD patterns of samples NT-750, NT-850, NT-950, and NT-1050.