Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H

Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H–SiC

Zhou Tian-Yu^a),^b), Liu Xue-Chao†^a), Huang Wei^a), Zhuo Shi-Yi^a), Zheng Yan-Qing^a), Shi Er-Wei^a)

The I – V curves of samples NT-750, NT-850, NT-950, and NT-1050. The inset shows the zoomed part of I – V curve of sample NT-750.