Resonance enhanced electron impact excitation for P-like Cu XV*
Li Shuanga),b), Yan Junc),d), Li Chuan-Yingc), Huang Mina),b), Chen Chong-Yanga),b)
       
Line intensity ratios (in photon units) of line pairs (a) 3–10/1–6 and (b) 3–10/1–7 at T e = 106.4 K are obtained from CRM together with DE+RE effective collision strengths from the IPIRDW (dotted-line) and DRM (solid line) approaches and DE ones from the RDW method (dashed-line).