<bold><em> In situ</em></bold> electrical transport measurementof superconductive ultrathin films<xref ref-type="fn" rid="cpb151726fn1">*</xref>

In situ electrical transport measurementof superconductive ultrathin films*

Liu Can-Hua^a),^b), Jia Jin-Feng^a),^b)

Results of in situ 4PP transport measurement on single-layer FeSe/STO.^{[ 8 , 40 ]} (a) Linear I – V curves recorded between each 4PP tip and the FeSe/STO sample, indicating nearly Ohmic contacts. (b) Temperature dependence of zero-bias resistance measured at different tip locations. Inset is some typical 4PP I – V curves recorded at around 110 K. (c) Temperature dependence of critical current. The solid curve is a fit to Eq. ( 6 ).