Analysis of the interdigitated back contact solar cells: The n-type substrate lifetime and wafer thickness

Zhang Wei^a), Chen Chen^a), Jia Rui†^a), Sun Yun^a), Xing Zhao^a), Jin Zhi^a), Liu Xin-Yu^a), Liu Xiao-Wen^b)

(a) Variations of TCAD simulated short circuit current density with wafer thickness with τ _bulk decreasing, (b) variations of calculated EQE of IBC solar cells with substrate thickness for 2-ms τ _bulk, (c) variations of calculated EQE of IBC solar cells with substrate thickness for 62.5-μs τ _bulk, and (d) variations of integrated EQE with substrate thickness for 62.5-μs τ _bulk.