Investigation of noise properties in grating-based x-ray phase tomography with reverse projection method

Bao Yuan†^a),^b), Wang Yan^b), Gao Kun^a), Wang Zhi-Li^a), Zhu Pei-Ping‡^a),^b), Wu Zi-Yu^a),^b)

Working principle sketch of the grating interferometer. (a) Through the Talbot self-imaging, a periodic interference pattern is formed in the plane of the analyzer grating (G₂), (b) plot of the intensity oscillation (shifting curve) as a function of the grating position x _g for a detector pixel over one period of the analyzer grating. The dots correspond to the normalized measurements while the solid curve shows a sinusoidal fit.