An improved GGNMOS triggered SCR for high holding voltage ESD protection applications
Zhang Shuai†
a)
, Dong Shu-Rong
b)
, Wu Xiao-Jing
a)
, Zeng Jie
b)
, Zhong Lei
b)
, Wu Jian
b)
Comparisons of TLP characteristic among GGNMOS, LVTSCR, and GGSCR.