The interface density dependence of the electrical properties of 0.9Pb(Sc0.5Ta0.5)O3–0.1PbTiO3/0.55Pb(Sc0.5Ta0.5)O3–0.45PbTiO3 multilayer thin films

The interface density dependence of the electrical properties of 0.9Pb(Sc_0.5Ta_0.5)O₃–0.1PbTiO₃/0.55Pb(Sc_0.5Ta_0.5)O₃–0.45PbTiO₃ multilayer thin films

Li Xue-Dong^a),^b), Liu Hong^b), Wu Jia-Gang^b), Liu Gang^a), Xiao Ding-Quan^b), Zhu Jian-Guo†^b)

XRD patterns of (a) the (PSTT10/45)_n thin films and (b) the corresponding expanded XRD patterns of the (200) peak. Surface morphologies of the (PSTT10/45)_n thin films with (c) n = 2, (d) n = 4 and (e) n = 6. Cross section images of the films with (f) n = 1 and (g) n = 2.