Fermi level pinning effects at gate–dielectric interfaces influenced by interface state densities
Hong Wen-Ting, Han Wei-Hua†, Lyu Qi-Feng, Wang Hao, Yang Fu-Hua
       
Plots of pinning factor of metal silicide S m−Si versus interface state density D m−Si for NiSi–Al2O3 with various values of D dm−Si.