Effect of the annealing temperature on the long-term thermal stability of Pt/Si/Ta/Ti/4H–SiC contacts
Cheng Yue, Zhao Gao-Jie, Liu Yi-Hong, Sun Yu-Jun, Wang Tao, Chen Zhi-Zhan†
       
Change tendencies of the specific contact resistance after the Ohmic contacts have been aged at 600 °C in air for different times.