Effect of the annealing temperature on the long-term thermal stability of Pt/Si/Ta/Ti/4H–SiC contacts
Cheng Yue, Zhao Gao-Jie, Liu Yi-Hong, Sun Yu-Jun, Wang Tao, Chen Zhi-Zhan†
       
Current–voltage characteristics of the Pt/Si/Ta/Ti contacts annealed at different temperatures for 2 min in Ar atmosphere. 1: 4R00; 2: 4R600; 3: 4R700; 4: 4R800; 5: 4R900; 6: 4R1000; 7: 4R1050; 8: 4R1100.