Analysis of the spatial filter of a dielectric multilayer film reflective cutoff filter-combination device

Zhang Ying^a),^b), Qi Hong-Ji^a), Yi Kui^a), Wang Yan-Zhi^a), Sui Zhan^c), Shao Jian-Da†^a)

Physical thickness of the layer versus layer number for the final optimally designed reflective film, where H represents the highly refractive material Ta₂O₅ and L refers to the lowly refractive material SiO₂.