TY - Chin. Phys. B A1 - Ying-Zhe Wang(王颖哲), Mao-Sen Wang(王茂森), Ning Hua(化宁), Kai Chen(陈凯), Zhi-Min He(何志敏), Xue-Feng Zheng(郑雪峰), Pei-Xian Li(李培咸), Xiao-Hua Ma(马晓华), Li-Xin Guo(郭立新), and Yue Hao(郝跃) T1 - Effects of electrical stress on the characteristics and defect behaviors in GaN-based near-ultraviolet light emitting diodes Y1 - 2022-05-17 JF - Chinese Physics B JO - Chin. Phys. B SP - 68101 EP - 068101 VL - 31 IS - 6 UR - https://cpb.iphy.ac.cn N1 - 10.1088/1674-1056/ac4cb8 ER -