Single event effects evaluation on convolution neural network in Xilinx 28 nm system on chip

doi:10.1088/1674-1056/ad3b82

Abstract Convolutional neural networks (CNNs) exhibit excellent performance in the areas of image recognition and object detection, which can enhance the intelligence level of spacecraft. However, in aerospace, energetic particles, such as heavy ions, protons, and alpha particles, can induce single event effects (SEEs) that lead CNNs to malfunction and can significantly impact the reliability of a CNN system. In this paper, the MNIST CNN system was constructed based on a 28 nm system-on-chip (SoC), and then an alpha particle irradiation experiment and fault injection were applied to evaluate the SEE of the CNN system. Various types of soft errors in the CNN system have been detected, and the SEE cross sections have been calculated. Furthermore, the mechanisms behind some soft errors have been explained. This research will provide technical support for the design of radiation-resistant artificial intelligence chips.

Keywords: single event effects convolutional neural networks alpha particle system on chip fault injection

Received: 09 January 2024
Revised: 29 February 2024
Accepted manuscript online: 07 April 2024

PACS:	85.30.De	(Semiconductor-device characterization, design, and modeling)
	61.82.Fk	(Semiconductors)
	85.35.-p	(Nanoelectronic devices)

Fund: Project supported by the National Natural Science Foundation of China (Grant No. 12305303), the Natural Science Foundation of Hunan Province of China (Grant Nos. 2023JJ40520, 2021JJ40444, and 2019JJ30019), the Research Foundation of Education Bureau of Hunan Province of China (Grant No. 20A430), the Science and Technology Innovation Program of Hunan Province (Grant No. 2020RC3054), the Natural Science Basic Research Plan in the Shaanxi Province of China (Grant No. 2023-JC-QN-0015), and the Doctoral Research Fund of University of South China.

Corresponding Authors: Xuecheng Du
E-mail: duxuecheng@usc.edu.cn

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Xu Zhao(赵旭), Xuecheng Du(杜雪成), Xu Xiong(熊旭), Chao Ma(马超), Weitao Yang(杨卫涛), Bo Zheng(郑波), and Chao Zhou(周超) Single event effects evaluation on convolution neural network in Xilinx 28 nm system on chip 2024 Chin. Phys. B 33 078501

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Single event effects evaluation on convolution neural network in Xilinx 28 nm system on chip

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