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DC and analog/RF performance of C-shaped pocket TFET (CSP-TFET) with fully overlapping gate |
Zi-Xin Chen(陈子馨)1, Wei-Jing Liu(刘伟景)1,†, Jiang-Nan Liu(刘江南)1, Qiu-Hui Wang(王秋蕙)1, Xu-Guo Zhang(章徐国)1, Jie Xu(许洁)1, Qing-Hua Li(李清华)2, Wei Bai(白伟)3, and Xiao-Dong Tang(唐晓东)3 |
1 College of Electronics and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China; 2 GTA Semiconductor Corporation Limited, Shanghai 200123, China; 3 Key Laboratory of Polar Materials and Devices, East China Normal University, Shanghai 200041, China |
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Abstract A C-shaped pocket tunnel field effect transistor (CSP-TFET) has been designed and optimized based on the traditional double-gate TFETs by introducing a C-shaped pocket region between the source and channel to improve the device performance. A gate-to-pocket overlapping structure is also examined in the proposed CSP-TFET to enhance the gate controllability. The effects of the pocket length, pocket doping concentration and gate-to-pocket overlapping structure on the DC and analog/RF characteristics of the CSP-TFET are estimated after calibrating the tunneling model in double-gate TFETs. The DC and analog/RF performance such as on-state current (Ion), on/off current ratio (Ion/Ioff), subthreshold swing (SS) transconductance (gm), cut-off frequency (fT) and gain-bandwidth product (GBP) are investigated. The optimized CSPTFET device exhibits excellent performance with high Ion (9.98×10 - 4 A/μm), high Ion/Ioff (~ 1011), as well as low SS (~ 12 mV/dec). The results reveal that the CSP-TFET device could be a potential alternative for the next generation of semiconductor devices.
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Received: 01 November 2021
Revised: 27 November 2021
Accepted manuscript online:
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PACS:
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85.30.Mn
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(Junction breakdown and tunneling devices (including resonance tunneling devices))
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85.30.Tv
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(Field effect devices)
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81.05.Cy
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(Elemental semiconductors)
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Fund: Project supported by the National Natural Science Foundation of China (Grant Nos.52177185 and 62174055) and Open Fund of Shanghai Key Laboratory of Multidimensional Information Processing,East China Normal University (Grant No.2019MIP002). |
Corresponding Authors:
Wei-Jing Liu,E-mail:liuwj5500@163.com
E-mail: liuwj5500@163.com
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About author: 2021-12-16 |
Cite this article:
Zi-Xin Chen(陈子馨), Wei-Jing Liu(刘伟景), Jiang-Nan Liu(刘江南), Qiu-Hui Wang(王秋蕙), Xu-Guo Zhang(章徐国), Jie Xu(许洁), Qing-Hua Li(李清华), Wei Bai(白伟), and Xiao-Dong Tang(唐晓东) DC and analog/RF performance of C-shaped pocket TFET (CSP-TFET) with fully overlapping gate 2022 Chin. Phys. B 31 058501
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