Measurement of far-infrared surface phonon polaritons in AlN nanowires via electron microscope
Chao He(何超), Ze Hua(华泽), Peiyi He(何沛一), Ruishi Qi(亓瑞时), Yuehui Li(李跃辉), Ruiwen Shao(邵瑞文), Weikang Dong(董伟康), Ruochen Shi(时若晨), Yeliang Wang(王业亮), and Peng Gao(高鹏)
Measurement of far-infrared surface phonon polaritons in AlN nanowires via electron microscope
Chao He(何超), Ze Hua(华泽), Peiyi He(何沛一), Ruishi Qi(亓瑞时), Yuehui Li(李跃辉), Ruiwen Shao(邵瑞文), Weikang Dong(董伟康), Ruochen Shi(时若晨), Yeliang Wang(王业亮), and Peng Gao(高鹏)
中国物理B
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2026, (3): 37901
-037901
.
DOI: 10.1088/1674-1056/ae2a00