Heavy-ions-induced failure mechanisms and structural damage in SiC MOSFETs under complex irradiation conditions
Yiping Xiao(肖一平), Chaoming Liu(刘超铭), Jiaming Zhou(周佳明), Le Gao(高乐), Mingzheng Wang(王铭峥), Tianqi Wang(王天琦), and Mingxue Huo(霍明学)
Heavy-ions-induced failure mechanisms and structural damage in SiC MOSFETs under complex irradiation conditions
Yiping Xiao(肖一平), Chaoming Liu(刘超铭), Jiaming Zhou(周佳明), Le Gao(高乐), Mingzheng Wang(王铭峥), Tianqi Wang(王天琦), and Mingxue Huo(霍明学)
中国物理B
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2026, (1): 18503
-018503
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DOI: 10.1088/1674-1056/ae07ad