Surface solitonic charge distribution on 2D materials investigated using Kelvin probe force microscopy technique based on qplus atomic force microscopy
Rui Song(宋睿), Feng Hao(郝峰), Jie Yang(杨杰), Lifeng Yin(殷立峰), and Jian Shen(沈健)
Surface solitonic charge distribution on 2D materials investigated using Kelvin probe force microscopy technique based on qplus atomic force microscopy
Rui Song(宋睿), Feng Hao(郝峰), Jie Yang(杨杰), Lifeng Yin(殷立峰), and Jian Shen(沈健)
中国物理B . 2025, (5): 56802 -056802 .  DOI: 10.1088/1674-1056/adbee8