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Three-dimensional crystal defect imaging by STEM depth sectioning
Ryo Ishikawa, Naoya Shibata, and Yuichi Ikuhara
Three-dimensional crystal defect imaging by STEM depth sectioning
Ryo Ishikawa, Naoya Shibata, and Yuichi Ikuhara
中国物理B . 2024, (
8
): 86101 -086101 . DOI: 10.1088/1674-1056/ad4ff9