Analysis of displacement damage effects on the charge-coupled device induced by neutrons at Back-n in the China Spallation Neutron Source
Yuan-Yuan Xue(薛院院), Zu-Jun Wang(王祖军), Wei Chen(陈伟), Xiao-Qiang Guo(郭晓强), Zhi-Bin Yao(姚志斌), Bao-Ping He(何宝平), Xu Nie(聂栩), Shankun Lai(赖善坤), Gang Huang(黄港), Jiang-Kun Sheng(盛江坤), Wu-Ying Ma(马武英), and Shi-Long Gou(缑石龙)
Analysis of displacement damage effects on the charge-coupled device induced by neutrons at Back-n in the China Spallation Neutron Source
Yuan-Yuan Xue(薛院院), Zu-Jun Wang(王祖军), Wei Chen(陈伟), Xiao-Qiang Guo(郭晓强), Zhi-Bin Yao(姚志斌), Bao-Ping He(何宝平), Xu Nie(聂栩), Shankun Lai(赖善坤), Gang Huang(黄港), Jiang-Kun Sheng(盛江坤), Wu-Ying Ma(马武英), and Shi-Long Gou(缑石龙)
中国物理B
.
2023, (7): 76101
-076101
.
DOI: 10.1088/1674-1056/acac07