Secondary electron emission and photoemission from a negative electron affinity semiconductor with large mean escape depth of excited electrons
Ai-Gen Xie(谢爱根), Hong-Jie Dong(董红杰), and Yi-Fan Liu(刘亦凡)
Secondary electron emission and photoemission from a negative electron affinity semiconductor with large mean escape depth of excited electrons
Ai-Gen Xie(谢爱根), Hong-Jie Dong(董红杰), and Yi-Fan Liu(刘亦凡)
中国物理B . 2023, (4): 48102 -048102 .  DOI: 10.1088/1674-1056/ac7dbd