Quantitative measurement of the charge carrier concentration using dielectric force microscopy
Junqi Lai(赖君奇), Bowen Chen(陈博文), Zhiwei Xing(邢志伟), Xuefei Li(李雪飞), Shulong Lu(陆书龙), Qi Chen(陈琪), and Liwei Chen(陈立桅)
Quantitative measurement of the charge carrier concentration using dielectric force microscopy
Junqi Lai(赖君奇), Bowen Chen(陈博文), Zhiwei Xing(邢志伟), Xuefei Li(李雪飞), Shulong Lu(陆书龙), Qi Chen(陈琪), and Liwei Chen(陈立桅)
中国物理B
.
2023, (3): 37202
-037202
.
DOI: 10.1088/1674-1056/aca7e6