Strategy to mitigate single event upset in 14-nm CMOS bulk FinFET technology
Dong-Qing Li(李东青), Tian-Qi Liu(刘天奇), Pei-Xiong Zhao(赵培雄), Zhen-Yu Wu(吴振宇), Tie-Shan Wang(王铁山), and Jie Liu(刘杰)
Strategy to mitigate single event upset in 14-nm CMOS bulk FinFET technology
Dong-Qing Li(李东青), Tian-Qi Liu(刘天奇), Pei-Xiong Zhao(赵培雄), Zhen-Yu Wu(吴振宇), Tie-Shan Wang(王铁山), and Jie Liu(刘杰)
中国物理B
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2022, (5): 56106
-056106
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DOI: 10.1088/1674-1056/ac3d7e