Variation of electron density in spectral broadening process in solid thin plates at 400 nm
Si-Yuan Xu(许思源), Yi-Tan Gao(高亦谈), Xiao-Xian Zhu(朱孝先), Kun Zhao(赵昆), Jiang-Feng Zhu(朱江峰), and Zhi-Yi Wei(魏志义)
Variation of electron density in spectral broadening process in solid thin plates at 400 nm
Si-Yuan Xu(许思源), Yi-Tan Gao(高亦谈), Xiao-Xian Zhu(朱孝先), Kun Zhao(赵昆), Jiang-Feng Zhu(朱江峰), and Zhi-Yi Wei(魏志义)
中国物理B
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2021, (10): 104205
-104205
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DOI: 10.1088/1674-1056/abf0fe