A new algorithm based on C-V characteristics to extract the epitaxy layer parameters for power devices with the consideration of termination
Jiupeng Wu(吴九鹏), Na Ren(任娜), and Kuang Sheng(盛况)
中国物理B . 2021, (4): 48505 .  DOI: 10.1088/1674-1056/abcf9e