Enhanced mobility of MoS 2 field-effect transistors by combining defect passivation with dielectric-screening effect
Zhao Li(李钊), Jing-Ping Xu(徐静平), Lu Liu(刘璐), and Xin-Yuan Zhao(赵心愿)
中国物理B . 2021, (1): 18102 .  DOI: 10.1088/1674-1056/abb30f