PBTI stress-induced 1/ f noise in n-channel FinFET
Dan-Yang Chen(陈丹旸), Jin-Shun Bi(毕津顺), Kai Xi(习凯), and Gang Wang(王刚)
中国物理B . 2020, (12): 128501 .  DOI: 10.1088/1674-1056/abaee4