Surface passivation in n-type silicon and its application insilicon drift detector

吴怡清, 陶科, 姜帅, 贾锐, 黄也

Yiqing Wu(吴怡清), Ke Tao(陶科), Shuai Jiang(姜帅), Rui Jia(贾锐), Ye Huang(黄也)

中国物理B . 2020, (3): 37702 -037702 . DOI: 10.1088/1674-1056/ab695e