Thermal conductivity characterization of ultra-thin silicon film using the ultra-fast transient hot strip method
张燕燕, 程然, 倪东, 田明, 卢继武, 赵毅
Thermal conductivity characterization of ultra-thin silicon film using the ultra-fast transient hot strip method
Yan-Yan Zhang(张燕燕), Ran Cheng(程然), Dong Ni(倪东), Ming Tian(田明), Ji-Wu Lu(卢继武), Yi Zhao(赵毅)
中国物理B
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2019, (7): 78105
-078105
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DOI: 10.1088/1674-1056/28/7/078105