Analysis of displacement damage effects on bipolar transistors irradiated by spallation neutrons
刘岩, 陈伟, 贺朝会, 苏春垒, 王晨辉, 金晓明, 李俊霖, 薛院院
Analysis of displacement damage effects on bipolar transistors irradiated by spallation neutrons
Yan Liu(刘岩), Wei Chen(陈伟), Chaohui He(贺朝会), Chunlei Su(苏春垒), Chenhui Wang(王晨辉), Xiaoming Jin(金晓明), Junlin Li(李俊霖), Yuanyuan Xue(薛院院)
中国物理B
.
2019, (6): 67302
-067302
.
DOI: 10.1088/1674-1056/28/6/067302