Influence of deep defects on electrical properties of Ni/4H-SiC Schottky diode
李金岚, 李赟, 汪玲, 徐跃, 闫锋, 韩平, 纪小丽
Influence of deep defects on electrical properties of Ni/4H-SiC Schottky diode
Jin-Lan Li(李金岚), Yun Li(李赟), Ling Wang(汪玲), Yue Xu(徐跃), Feng Yan(闫锋), Ping Han(韩平), Xiao-Li Ji(纪小丽)
中国物理B
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2019, (2): 27303
-027303
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DOI: 10.1088/1674-1056/28/2/027303