Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors
张东, 武辰飞, 徐尉宗, 任芳芳, 周东, 于芃, 张荣, 郑有炓, 陆海
Investigation and active suppression of self-heating induced degradation in amorphous InGaZnO thin film transistors
Dong Zhang(张东), Chenfei Wu(武辰飞), Weizong Xu(徐尉宗), Fangfang Ren(任芳芳), Dong Zhou(周东), Peng Yu(于芃), Rong Zhang(张荣), Youdou Zheng(郑有炓), Hai Lu(陆海)
中国物理B
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2019, (1): 17303
-017303
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DOI: 10.1088/1674-1056/28/1/017303