Damage effects and mechanism of the silicon NPN monolithic composite transistor induced by high-power microwaves

李慧, 柴常春, 刘彧千, 吴涵, 杨银堂

Hui Li(李慧), Chang-Chun Chai(柴常春), Yu-Qian Liu(刘彧千), Han Wu(吴涵), Yin-Tang Yang(杨银堂)

中国物理B . 2018, (8): 88502 -088502 . DOI: 10.1088/1674-1056/27/8/088502