Dependence of single event upsets sensitivity of low energy proton on test factors in 65 nm SRAM
罗尹虹, 张凤祁, 潘霄宇, 郭红霞, 王圆明
Dependence of single event upsets sensitivity of low energy proton on test factors in 65 nm SRAM
Yin-Yong Luo(罗尹虹), Feng-Qi Zhang(张凤祁), Xiao-Yu Pan(潘霄宇), Hong-Xia Guo(郭红霞), Yuan-Ming Wang(王圆明)
中国物理B . 2018, (7): 78501 -078501 .  DOI: 10.1088/1674-1056/27/7/078501