Physics-based analysis and simulation model of electromagnetic interference induced soft logic upset in CMOS inverter

刘彧千, 柴常春, 张宇航, 史春蕾, 刘阳, 樊庆扬, 杨银堂

Yu-Qian Liu(刘彧千), Chang-Chun Chai(柴常春), Yu-Hang Zhang(张宇航), Chun-Lei Shi(史春蕾), Yang Liu(刘阳), Qing-Yang Fan(樊庆扬), Yin-Tang Yang(杨银堂)

中国物理B . 2018, (6): 68505 -068505 . DOI: 10.1088/1674-1056/27/6/068505