Degradation of current-voltage and low frequency noise characteristics under negative bias illumination stress in InZnO thin film transistors
王黎, 刘远, 耿魁伟, 陈雅怡, 恩云飞
Degradation of current-voltage and low frequency noise characteristics under negative bias illumination stress in InZnO thin film transistors
Li Wang(王黎), Yuan Liu(刘远), Kui-Wei Geng(耿魁伟), Ya-Yi Chen(陈雅怡), Yun-Fei En(恩云飞)
中国物理B . 2018, (6): 68504 -068504 .  DOI: 10.1088/1674-1056/27/6/068504