Off-stoichiometry indexation of BiFeO
3 thin film on silicon by Rutherford backscattering spectrometry
王泽松, 肖仁政, 邹长伟, 谢伟, 田灿鑫, 薛书文, 刘贵昂, 付德君
Off-stoichiometry indexation of BiFeO
3 thin film on silicon by Rutherford backscattering spectrometry
Ze-Song Wang(王泽松), Ren-Zheng Xiao(肖仁政), Chang-Wei Zou(邹长伟), Wei Xie(谢伟), Can-Xin Tian(田灿鑫), Shu-Wen Xue(薛书文), Gui-Ang Liu(刘贵昂), Neena Devi, De-Jun Fu(付德君)
中国物理B
.
2018, (4): 47901
-047901
.
DOI: 10.1088/1674-1056/27/4/047901