Progressive current degradation and breakdown behavior in GaN LEDs under high reverse bias stress
赵琳娜, 于沛洪, 郭子骧, 闫大为, 周浩, 吴锦波, 崔志强, 孙华锐, 顾晓峰
Progressive current degradation and breakdown behavior in GaN LEDs under high reverse bias stress
Linna Zhao(赵琳娜), Peihong Yu(于沛洪), Zixiang Guo(郭子骧), Dawei Yan(闫大为), Hao Zhou(周浩), Jinbo Wu(吴锦波), Zhiqiang Cui(崔志强), Huarui Sun(孙华锐), Xiaofeng Gu(顾晓峰)
中国物理B
.
2017, (8): 87308
-087308
.
DOI: 10.1088/1674-1056/26/8/087308