Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell
叶兵, 刘杰, 王铁山, 刘天奇, 罗捷, 王斌, 殷亚楠, 姬庆刚, 胡培培, 孙友梅, 侯明东
Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell
Bing Ye(叶兵), Jie Liu(刘杰), Tie-Shan Wang(王铁山), Tian-Qi Liu(刘天奇), Jie Luo(罗捷), Bin Wang(王斌), Ya-Nan Yin(殷亚楠), Qing-Gang Ji(姬庆刚), Pei-Pei Hu(胡培培), You-Mei Sun(孙友梅), Ming-Dong Hou(侯明东)
中国物理B
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2017, (8): 88501
-088501
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DOI: 10.1088/1674-1056/26/8/088501