Structural characterization of Al
0.55Ga
0.45N epitaxial layer determined by high resolution x-ray diffraction and transmission electron microscopy
徐庆君, 刘斌, 张士英, 陶涛, 谢自力, 修向前, 陈敦军, 陈鹏, 韩平, 张荣, 郑有炓
Structural characterization of Al
0.55Ga
0.45N epitaxial layer determined by high resolution x-ray diffraction and transmission electron microscopy
Qing-Jun Xu(徐庆君), Bin Liu(刘斌), Shi-Ying Zhang(张士英), Tao Tao(陶涛), Zi-Li Xie(谢自力), Xiang-Qian Xiu(修向前), Dun-Jun Chen(陈敦军), Peng Chen(陈鹏), Ping Han(韩平), Rong Zhang(张荣), You-Dou Zheng(郑有炓)
中国物理B
.
2017, (4): 47801
-047801
.
DOI: 10.1088/1674-1056/26/4/047801