Improvement in the electrical performance and bias-stress stability of dual-active-layered silicon zinc oxide/zinc oxide thin-film transistor
刘玉荣, 赵高位, 黎沛涛, 姚若河
Improvement in the electrical performance and bias-stress stability of dual-active-layered silicon zinc oxide/zinc oxide thin-film transistor
Yu-Rong Liu(刘玉荣), Gao-Wei Zhao(赵高位), Pai-To Lai(黎沛涛), Ruo-He Yao(姚若河)
中国物理B . 2016, (8): 88503 -088503 .  DOI: 10.1088/1674-1056/25/8/088503