Distribution of electron traps in SiO
2/HfO
2 nMOSFET
侯晓慧, 郑雪峰, 王奥琛, 王颖哲, 文浩宇, 刘志镜, 李小炜, 吴银河
Distribution of electron traps in SiO
2/HfO
2 nMOSFET
Xiao-Hui Hou(侯晓慧), Xue-Feng Zheng(郑雪峰), Ao-Chen Wang(王奥琛), Ying-Zhe Wang(王颖哲), Hao-Yu Wen(文浩宇), Zhi-Jing Liu(刘志镜), Xiao-Wei Li(李小炜), Yin-He Wu(吴银河)
中国物理B
.
2016, (5): 57702
-057702
.
DOI: 10.1088/1674-1056/25/5/057702